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IEEE International Conference on Microelectronic Test Structures

ICMTS Archives

All papers are available from IEEE Xplore (IEEE account required).

A list of “Best Paper” winners is also available.

Year City Country Program
2023 Tokyo Japan HTML PDF
2022 Virtual Virtual HTML PDF
2020 Virtual Virtual HTML PDF
2019 Kitakyushu Japan HTML PDF
2018 Austin USA HTML PDF
2017 Grenoble France HTML PDF
2016 Yokohama Japan HTML PDF
2015 Phoenix USA HTML PDF
2014 Udine Italy HTML PDF
2013 Osaka Japan HTML PDF
2012 San Diego USA HTML PDF
2011 Amsterdam The Netherlands HTML PDF
2010 Hiroshima Japan HTML PDF
2009 Oxnard USA HTML PDF
2008 Edinburgh Scotland, UK HTML PDF
2007 Tokyo Japan HTML PDF
2006 Austin USA HTML PDF
2005 Leuven Belgium HTML PDF
2004 Hyogo Japan HTML PDF
2003 Monterey USA HTML PDF
2002 Cork Ireland HTML PDF
2001 Kobe Japan HTML PDF
2000 Monterey USA HTML PDF
1999 Goteborg Sweden HTML PDF
1998 Kanazawa Japan HTML PDF
1997 Monterey USA HTML PDF
1996 Trento Italy HTML PDF
1995 Nara Japan HTML
1994 San Diego USA HTML
1993 Barcelona Spain HTML
1992 San Diego USA HTML
1991 Kyoto Japan HTML
1990 San Diego USA HTML
1989 Edinburgh Scotland, UK HTML
1988 Long Beach USA HTML
1986 Long Beach USA PDF (Test Structure Workshop)
1984 San Diego USA PDF (Test Structure Workshop)
1979 San Jose USA PDF (Microelectronics Measurement
Technology Seminar)

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