IEEE International Conference on Microelectronic Test Structures
ICMTS ‛Best Presentations’ Winners
| 2026 | 4.2 | Extraction of Shockley-Read-Hall lifetime at the InGaP/Al2O3 interface using transient capacitance relaxation P. Kirilenko, P. L. Torraca, R. Bharti, M. Jain, S. Bonam, L. Ansari, F. Gity, K. Cherkaoui, E. Pelucchi1, G. Juska1, A. Tonkikh, A. Arnlind, D. Sizov, P. Gore, M. Grundmann, P. K. Hurley MicroNano Systems Department, Tyndall National Institute, Cork, Ireland 1Photonics Department, Tyndall National Institute, Cork, Ireland DOI: 10.1109/ICMTS69943.2026.11471653 HOVER FOR ABSTRACT | PDF Xplore |
| 2025 | 4.3 | Non-uniformities in MOSFET-array characteristics caused by probe-induced mechanical stress P. Sarazá-Canflanca, X. Fan1, S. Van Beek, E. Bury, B. Kaczer imec, Leuven, Belgium 1Chengdu Technological University, Chengdu, Sichuan, P.R.China DOI: 10.1109/ICMTS63811.2025.11068898 HOVER FOR ABSTRACT | PDF Xplore |
