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ICMTS in General

The IEEE International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.

It usually takes place in late March and the location rotates between Japan, Europe, and the United States.

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ICMTS 2025 Timeline

Apr-Oct, 2024 Authors prepare their abstracts
Early Oct, 2024 Abstract uploads begin
Nov 29, 2024 Abstract submission deadline
Late Jan, 2025 Authors notified of acceptance
Mar 24-27, 2025 ICMTS 2025

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