About ICMTS

The IEEE International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions. The location rotates between Japan, Europe, and the United States. The meeting is an IEEE technically sponsored conference, sponsored by the IEEE Electron Devices Society.

Several dozen subject matter experts from around the world volunteer their time to be members of the Technical Program Committee (TPC), which includes reviewing the abstracts submitted for publication. Each year’s conference is organized by a group of volunteers from the TPC. The Steering Committee manages the conference and assists that year’s organizing committee.

ICMTS Permanent Steering Committee

Chair, 班長

Yoshio MITA
The University of Tokyo

mita

@

ee.t.u-tokyo.ac.jp

European Representative

Carlo CAGLI
STMicroelectronics N.V.

carlo.cagli

@

st.com

Asian Representative

Tatsuya OHGURO
Toshiba Corporation

tatsuya.ohguro.h75

@

mail.toshiba

North American Representative

Brad SMITH
BeeSmith, LLC

beesmith.llc

@

outlook.com

European Representative

Stewart SMITH
The University of Edinburgh

stewart.smith

@

ed.ac.uk

North American Representative

Larg WEILAND
PDF Solutions, Inc.

larg.weiland

@

pdf.com

ICMTS 2027 Organizing Committee

General Chair

Francesco DRIUSSI
Università degli Studi di Udine

francesco.driussi

@

uniud.it

Technical Program Chair

Jerome MITARD
imec

Jerome.Mitard

@

imec.be

Publication Chair

Daniel LIZZIT
Università degli Studi di Udine

daniel.lizzit

@

uniud.it

Tutorial Chair

Alexey KOVALGIN
University of Twente

a.y.kovalgin

@

utwente.nl

Exhibition Chair

Luca PIRRO
GlobalFoundries

pirroluca

@

gmail.com

Web Support

Brad SMITH
BeeSmith, LLC

beesmith.llc

@

outlook.com

Web Support

Larg WEILAND
PDF Solutions, Inc.

larg.weiland

@

pdf.com

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