IEEE International Conference on Microelectronic Test Structures
About ICMTS
The IEEE International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions. The location rotates between Japan, Europe, and the United States. The meeting is an IEEE technically sponsored conference, sponsored by the IEEE Electron Devices Society.
Several dozen subject matter experts from around the world volunteer their time to be members of the Technical Program Committee (TPC), which includes reviewing the abstracts submitted for publication. Each year’s conference is organized by a group of volunteers from the TPC. The Steering Committee manages the conference and assists the organizing committee.
ICMTS 2024 Organizing Committee
ICMTS Steering Committee
- Carlo CAGLI, STMicroelectronics N.V., FRANCE
- Satoshi HABU, Keysight Technologies International Japan G.K., JAPAN
- Yoshio MITA, The University of Tokyo, JAPAN
- Brad SMITH, NXP Semiconductors N.V., USA
- Stewart SMITH, The University of Edinburgh, UK
- Bill VERZI, Emeritus, USA – Chair, Grand Poobah, Big Cheese, Gross Legume, 班長
- Anthony J. WALTON, The University of Edinburgh, UK
- Larg WEILAND, PDF Solutions Inc., USA
Website
- Brad Smith, NXP Semiconductors NV, USA
- Larg Weiland, PDF Solutions Inc., USA
