Monday, Mar 23 | | 08:55 | Welcome | | 09:00 | Tutorial 1 | | 09:50 | Tutorial 2 | | 10:40 | Break | | 11:00 | Tutorial 3 | | 11:50 | Lunch | | 13:20 | Tutorial 4 | | 14:10 | Tutorial 5 | | 15:00 | Break | | 15:20 | Tutorial 6 | | 16:10 | Tutorial 7 | | 17:00 | Close | | 17:30 | Reception for All Attendees | | Tuesday, Mar 24 | | 09:00 | Welcome | | 09:10 | Session 1: Circuits for Test and Computation | | 10:50 | Session 2: AI and Machine Learning | | 12:10 | Lunch | | 13:30 | Session 3: Device Characterization | | 15:10 | Sponsors | | 15:50 | Session 4: Process Characterization | | Wednesday, Mar 25 | | 09:00 | Invited Talk 1 | | 10:00 | Session 5: MEMS and Sensors | | 11:20 | Session 6: Memory | | 12:40 | Lunch | | 14:00 | Session 7: Reliability | | 15:40 | ICMTS 2027 | | 15:50 | Session 8: ESD | | 16:50 | End of Day 2 | | 17:30 | Banquet | | Thursday, Mar 26 | | 08:45 | Invited Talk 2 | | 09:35 | Session 9: Cryogenics | | 10:50 | Session 10: Power Devices | | 12:10 | Best Paper Award, Closing | | 12:20 | Lunch and Excursion | |
