ICMTS 2025

Call for Papers

Example abstracts:  

Looking for the best opportunity to present and discuss your ideas and results about test structures, measurements, and characterization? This is your chance! Join the 37^th ICMTS conference.

This conference is co-sponsored by the IEEE Electron Devices Society. All presented papers will be submitted for potential inclusion in IEEE Xplore®. Original papers presenting new developments in topics relevant to ICMTS, include but not limited to test structures, measurements, and results, as outlined below. This one-track technical program will award a Best Paper that will be voted on by the Technical Program Committee. In addition, Tutorial Short Course will precede the main conference while several of the best measurement, equipment design, and manufacturing experts, will participate in the equipment exhibition and presentations.

• Design
  • Methodologies, Verification
  • Within-die circuits for process characterisation/monitoring
  • Design enablement – Characterisation and validation of digital and analog libraries
  • Devices and Circuit Modelling
• Measurement techniques
  • DC, AC and RF measurements: setup, test and analysis
  • Reliability test - including thermal stability, failure analysis etc.
  • Statistical analysis, variability, throughput increase, smart test strategies
  • Use of machine learning and AI in analysis of data sets - parameter extraction etc.
  • Wafer probing, within-die measurements, in-line metrology
  • Throughput, testing strategies, yield enhancement and process control tests
• Applications
  • Emerging memory technologies (single cell, arrays, and application in neural networks)
  • Emerging transistor technologies for digital/analog/power applications
  • Photonic devices - silicon integration, new displays (OLED, μ-displays)
  • Flexible electronics and sensors (organic and inorganic materials)
  • M(N)EMS, actuators, sensors, PV cells and other emerging devices

The author’s abstract submission consists of up to four pages in PDF format (font-embedded). The first page should include a title, a 50-word summary, author name(s), full address, contact number and e-mail of the lead author, and any preference for oral or poster session presentation. The body of the abstract should consist of one page of text (800 to 1000 words) and up to two pages of major figures and tables.

The selection process will be based on the technical merit and will be highly weighted in favour of abstracts with high test structure content, giving a clear illustration of the test structure and including measurements and data analysis.

The abstract submission deadline is November 29, 2024.

Submit an Abstract Here

Notice of paper acceptance will be sent to the selected authors by January 17, 2025, with instructions for the expanded manuscript preparation for the conference proceedings. The deadline for submission of the final paper will be Early March, 2025.

Please join the ICMTS group at https://www.linkedin.com/groups/3804498 if you have in interest all things test and measurement.

Details of the venue, hotel, conference registration, etc. are available here.

For further technical information, please contact the Technical Program Chair:
Dennis PRETTI, Micron Technology, Inc., djpretti@micron.com