Monday, April 15 | | 08:00 | Registration opens | | 09:00 | Tutorials Welcome | | 09:10 | Tutorial 1 | | 10:00 | Break | | 10:30 | Tutorial 2 | | 11:20 | Break | | 11:30 | Tutorial 3 | | 12:20 | Break | | 13:40 | Tutorial 4 | | 14:30 | Break | | 14:40 | Tutorial 5 | | 15:30 | Break | | 16:00 | Tutorial 6 | | 16:50 | Close of Tutorials | | 17:30 | Welcome Reception | | Tuesday, April 16 | | 08:00 | Registration opens | | 09:00 | Opening Remarks | | 09:10 | Session 1: Layout Dependent Effects | | 10:10 | Break | | 10:40 | Invited Talk - P. Loftus | | 11:20 | Session 2: Reliability | | 12:20 | Lunch | | 13:50 | Presentations by Exhibitors | | 14:20 | Session 3: Cryogenic Characterization | | 15:20 | Break | | 15:50 | Invited Talk - S. Slesazeck | | 16:30 | Session 4: Dielectrics and Ferroelectrics | | 17:30 | End of Day 1 | | 17:30 | Exhibitor and Sponsor Reception | | Wednesday, April 17 | | 09:00 | Bonus Talk - C. Cagli | | 09:30 | Invited Talk - V. Sandeep Nagaraja | | 10:10 | Break | | 10:40 | Session 5: MEMs and Sensors | | 12:00 | Lunch | | 13:30 | ICMTS 2025 Presentation | | 13:40 | Session 6: Wafer Measurements | | 15:00 | Break | | 15:20 | Invited Talk - M. Stucchi | | 16:00 | Session 7: S-Parameters and De-embedding | | 17:00 | End of Day 2 | | 19:00 | Banquet - Dovecot Studios | | Thursday, April 18 | | 09:30 | Session 8: GaN Technology | | 10:50 | Break | | 11:20 | Session 9: Process/Material Monitoring | | 12:20 | Best Paper Award, Closing | | 12:35 | Lunch for Excursion Attendees | | 13:30 | Excursion | |
